Simulation of Transport in Nanodevices

Editeur: ISTE Ltd and John Wiley & Sons Inc
Linear current-voltage pattern, has been and continues to be the basis for characterizing, evaluating performance, and designing integrated circuits, but is shown not to hold its supremacy as channel lengths are being scaled down.

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Linear current-voltage pattern, has been and continues to be the basis for characterizing, evaluating performance, and designing integrated circuits, but is shown not to hold its supremacy as channel lengths are being scaled down.
ISBN / EAN 9781848215665
Editeur ISTE Ltd and John Wiley & Sons Inc