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Semiconductor Device and Failure Analysis
Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.
2 360,00 DH
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Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.
| ISBN / EAN | 9780471492405 |
|---|---|
| Auteur | Chim, Wai Kin |
| Editeur | John Wiley & Sons Inc |