ISTFA (TM) 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis

Auteur: International, ASM
Editeur: A S M International
Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!

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Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!
ISBN / EAN 9781627081023
Auteur International, ASM
Editeur A S M International