ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis

Auteur: ASM International
Editeur: A S M International
The theme of this conference was "Failures Worth Analyzing". While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.

En stock

The theme of this conference was "Failures Worth Analyzing". While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
ISBN / EAN 9781627080996
Auteur ASM International
Editeur A S M International