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ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis
The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
1 760,00 DH
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The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
| ISBN / EAN | 9781627081504 |
|---|---|
| Auteur | ASM International |
| Editeur | A S M International |