Main image
Click to view image in fullscreen
![]()
ISTFA 2014, Proceedings from the 40th International Symposium for Testing and Failure Analysis
Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, "Exploring the Many Facets of Failure Analysis".
1 760,00 DH
En stock
Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, "Exploring the Many Facets of Failure Analysis".
| ISBN / EAN | 9781627080743 |
|---|---|
| Auteur | International, ASM |
| Editeur | A S M International |